Special Issue at Symmetry (MDPI) “Symmetry of Surface Quality and New Technologies”
Symmetry

Special Issue at Symmetry (MDPI) “Symmetry of Surface Quality and New Technologies”

Ramón Jerez (EEBE) is acting guest editor for this special issue that aims to gather and publish papers related with the measurement of roughness and texture through advanced techniques. The deadline to send contributions is 2march 2022. The Symmetry journal where the special issue is to be published has an IF of 2,713 in the Multidisciplinary Sciences category of the JCR.